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[Piezoscanner P-734] Optimal XY Piezoscanner for Scanning Microscopes

Flatness of 5 nm, resolution of 0.3 nm, achieving high-speed and high-precision operation with an XY-axis piezo scanner.

In the field of microscopic observation, precise positioning of samples and control of fine movements are essential for obtaining clear images. Particularly in high-magnification observations and analysis of microstructures, nanometer-level precision is required. Even slight misalignments or vibrations in positioning can significantly impact the observation results and hinder accurate data acquisition. The P-734 addresses these challenges with high-precision positioning and high-speed operation. 【Application Scenes】 - Optical Microscopes - Scanning Microscopes - Surface Shape Analysis 【Benefits of Implementation】 - Acquisition of high-precision observation images - Accurate analysis of microstructures - Reduction of observation time For detailed product specifications, please refer to the catalog. If you have any questions, please feel free to contact us.